Reliability of high dielectric Ba 0.5...

Integrated Ferroelectrics 1999 / 08 Vol. 24; Iss. 1-4

Reliability of high dielectric Ba 0.5 Sr 0.5 TiO 3 capacitors using iridium electrode

Cha, Seon Yong, Jang, Byung-Tak, Lee, Hee Chul
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Volume:
24
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589908215577
Date:
August, 1999
File:
PDF, 471 KB
english, 1999
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