![](/img/cover-not-exists.png)
[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Best test pattern failure analysis flow for functional logic failure localization by IR-OBIRCH technique
Machouat, A., Haller, G., Goubier, V., Lewis, D., Perdu, P., Pouget, V., Essely, F.Year:
2009
Language:
english
DOI:
10.1109/ipfa.2009.5232672
File:
PDF, 4.14 MB
english, 2009