[IEEE CAOL 2005. Second International Conference on...

[IEEE CAOL 2005. Second International Conference on Advanced Optoelectronics and Lasers, 2005. - Yalta, Crimea, Ukraine (12-17 Sept., 2005)] Proceedings of CAOL 2005. Second International Conference on Advanced Optoelectronics and Lasers, 2005. - Determination of refractive index profile of the planar waveguide by wedge technique and chemical sample preparation

Sadat Hosseini, S.M.R., Darudi, A., Tavassoly, M.T., Granpayeh, N., Goodarzi, A.

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Volume:

Year:

2005

Language:

english

DOI:

10.1109/caol.2005.1553967

File:

PDF, 1.72 MB

english, 2005

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