[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Testing the IBM Power 7™ 4 GHz eight core microprocessor
Crafts, James, Bogdan, David, Conti, Dennis, Forlenza, Donato, Forlenza, Orazio, Huott, William, Kusko, Mary, Seymour, Edward, Taylor, Timothy, Walsh, BrianYear:
2010
Language:
english
DOI:
10.1109/test.2010.5699204
File:
PDF, 403 KB
english, 2010