[IEEE 2012 24th International Conference on Microelectronics (ICM) - Algiers, Algeria (2012.12.16-2012.12.20)] 2012 24th International Conference on Microelectronics (ICM) - A novel method based on capacitance-voltage for negative bias temperatures instability studies: Concept and results
Benabdelmoumene, Abdelmadjid, Djezzar, Boualem, Tahi, Hakim, Chenouf, Amel, Trombetta, Leonard, Kechouane, MohamedYear:
2012
Language:
english
DOI:
10.1109/icm.2012.6471430
File:
PDF, 339 KB
english, 2012