[IEEE 19th European Microwave Conference, 1989 - London, UK (1989.10.4-1989.10.6)] 19th European Microwave Conference, 1989 - A Fully Automated On-Wafer Pulsed Measurement System, with Variable Pulse-Length and Duty Cycle, for Accurate Large Signal FET Modeling
Vidalou, J.F., Grossier, F., Camiade, M., Obregon, J.Year:
1989
Language:
english
DOI:
10.1109/euma.1989.334029
File:
PDF, 4.36 MB
english, 1989