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[IEEE 1989 Proceedings of the IEEE Custom Integrated Circuits Conference - San Diego, CA, USA (1989.05.15-1989.05.18)] 1989 Proceedings of the IEEE Custom Integrated Circuits Conference - An expert system to assist in diagnosis of failures on VLSI memories
Viacroze, T., Lequeux, M.Year:
1989
Language:
english
DOI:
10.1109/cicc.1989.56838
File:
PDF, 284 KB
english, 1989