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[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Alpha-particle-induced soft-error mechanism in semi-insulating GaAs substrate
Umemoto, Y., Matsunaga, N., Mitsusada, K.Year:
1988
Language:
english
DOI:
10.1109/relphy.1988.23435
File:
PDF, 459 KB
english, 1988