Degradation of Ultra-Thin Oxides

Degradation of Ultra-Thin Oxides

Irrera, F., Puzzilli, G.
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Volume:
4
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2004.836162
Date:
September, 2004
File:
PDF, 274 KB
english, 2004
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