[IEEE International Test Conference, 2003. ITC 2003. - Charlotte, NC, USA (Sept. 30,-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - IEEE 1149.6 - A practical perspective
Eklow, B., Barnhart, C., Ricchetti, M., Borroz, T.Volume:
2
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1271196
File:
PDF, 585 KB
english, 2003