[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Study on the Retention Time of Body Tied FINFET DRAM with Channel Directional Wafer
Lee, Chul, Kim, Keunnam, Cho, Eun, Ko, Sanggi, Kim, Chang, Park, Hyun, Kim, Dongchan, Lee, Choong-ho, Park, DonggunYear:
2006
Language:
english
DOI:
10.1109/relphy.2006.251340
File:
PDF, 240 KB
english, 2006