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[IEEE 2007 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - Salvador, Brazil (2007.10.29-2007.11.1)] 2007 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - Extraction of Microwave FET Noise Parameters Using Frequency- Dependent Equivalent Noise Temperatures
Ciccognani, W., Giannini, F., Limiti, E., Nanni, A., Serino, A., Lanzieri, C., Peroni, M.Year:
2007
Language:
english
DOI:
10.1109/imoc.2007.4404392
File:
PDF, 131 KB
english, 2007