[IEEE 2006 International Conference on Management Science and Engineering - Lille, France (2006.10.5-2006.10.7)] 2006 International Conference on Management Science and Engineering - A Coherent Risk Measure of the Intellectual Property Risk Based on Entropy
Ying, He, Rui-hua, Huang, Su-hong, RenYear:
2006
Language:
english
DOI:
10.1109/icmse.2006.314074
File:
PDF, 6.99 MB
english, 2006