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[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Active pixel image sensor scale down in 0.18 μm CMOS technology
Ho-Ching Chien,, Shou-Gwo Wuu,, Dun-Nian Yaung,, Chien-Hsien Tseng,, Jeng-Shyan Lin,, Wang, C.S., Chin-Kung Chang,, Yu-Kung Hsiao,Year:
2002
Language:
english
DOI:
10.1109/iedm.2002.1175962
File:
PDF, 185 KB
english, 2002