[IEEE 2012 14th International Conference on Electronic...

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[IEEE 2012 14th International Conference on Electronic Materials and Packaging (EMAP) - Lantau Island, Hong Kong (2012.12.13-2012.12.16)] 2012 14th International Conference on Electronic Materials and Packaging (EMAP) - Solder volume effects on fatigue life of BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu interconnects

Qin, Hong-Bo, Li, Xun-Ping, Zhang, Xin-Ping
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Year:
2012
Language:
english
DOI:
10.1109/emap.2012.6507908
File:
PDF, 1.08 MB
english, 2012
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