[IEEE 33rd European Microwave Conference, 2003 - Munich,...

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[IEEE 33rd European Microwave Conference, 2003 - Munich, Germany (2003.10.4-2003.10.6)] 33rd European Microwave Conference, 2003 - Oxidation effect on the loss characteristics of CPWs implemented on low resistivity substrate with thick Oxidized Porous Silicon (OPS) layer

Ha, Man-Lyun, Shin, Seong-Ho, Kim, Moon-Jung, Ko, Ju-Hyun, Kwon, Young-Se
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Year:
2003
Language:
english
DOI:
10.1109/euma.2003.340860
File:
PDF, 1.54 MB
english, 2003
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