[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Investigations of fin vertical nonuniformity effects on junctionless multigate transistor
Lou, Haijun, Li, Binghua, Lin, Xinnan, He, Jin, Chan, MansunYear:
2012
Language:
english
DOI:
10.1109/icsict.2012.6467617
File:
PDF, 389 KB
english, 2012