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[IEEE 2011 American Control Conference - San Francisco, CA (2011.6.29-2011.7.1)] Proceedings of the 2011 American Control Conference - Robust model matching for geometric fault detection filters
Seiler, Peter, Bokor, Jozsef, Vanek, Balint, Balas, Gary J.Year:
2011
Language:
english
DOI:
10.1109/acc.2011.5991249
File:
PDF, 195 KB
english, 2011