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[IEEE 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Monterey, CA, USA (2010.10.12-2010.10.15)] 2010 IEEE Nanotechnology Materials and Devices Conference - On-line sensing and visual feedback for atomic force microscopy (AFM) based nano-manipulations
Song, Bo, Xi, Ning, Yang, Ruiguo, Wai, King, Lai, Chiu, Qu, ChengengYear:
2010
Language:
english
DOI:
10.1109/nmdc.2010.5651906
File:
PDF, 1.87 MB
english, 2010