Measurement of lateral charge diffusion in thick, fully depleted, back-illuminated CCDs
Karcher, A., Bebek, C.J., Kolbe, W.F., Maurath, D., Prasad, V., Uslenghi, M., Wagner, M.Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.834721
Date:
October, 2004
File:
PDF, 414 KB
english, 2004