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[IEEE Comput. Soc. Press Records of the 1993 IEEE International Workshop on Memory Testing - San Jose, CA, USA (9-10 Aug. 1993)] Records of the 1993 IEEE International Workshop on Memory Testing - Algorithms to test PSF and coupling faults in random access memories
Rajsuman, R.Year:
1993
Language:
english
DOI:
10.1109/mt.1993.263150
File:
PDF, 481 KB
english, 1993