[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - On the cyclic threshold voltage shift of dynamic negative-bias temperature instability
Teo, Z. Q., Boo, A. A., Ang, D. S., Leong, K. C.Year:
2011
Language:
english
DOI:
10.1109/irps.2011.5784611
File:
PDF, 286 KB
english, 2011