Direct measurement of total emissivities at cryogenic...

Cryogenics 2008 Vol. 48; Iss. 11-12

Direct measurement of total emissivities at cryogenic temperatures: Application to satellite coatings

P. Herve, N. Rambure, A. Sadou, D. Ramel, L. Francou, P. Delouard, E. Gavila
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Volume:
48
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.cryogenics.2008.07.007
File:
PDF, 404 KB
english, 2008
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