[IEEE 2006 17th International Symposium on Software...

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[IEEE 2006 17th International Symposium on Software Reliability Engineering - Raleigh, NC, USA (2006.11.7-2006.11.7)] 2006 17th International Symposium on Software Reliability Engineering - Queuing Models for Field Defect Resolution Process

Gokhale, Swapna, Mullen, Robert
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Year:
2006
Language:
english
DOI:
10.1109/issre.2006.38
File:
PDF, 243 KB
english, 2006
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