[IEEE 2013 20th IEEE International Conference on Image...

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[IEEE 2013 20th IEEE International Conference on Image Processing (ICIP) - Melbourne, Australia (2013.09.15-2013.09.18)] 2013 IEEE International Conference on Image Processing - Automatic detection of dust and scratches in silver halide film using polarized dark-field illumination

Rufenacht, Dominic, Trumpy, Giorgio, Gschwind, Rudolf, Susstrunk, Sabine
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Year:
2013
Language:
english
DOI:
10.1109/icip.2013.6738432
File:
PDF, 3.33 MB
english, 2013
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