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[IEEE 2012 16th International Symposium on Electromagnetic Launch Technology (EML) - Beijing, China (2012.05.15-2012.05.19)] 2012 16th International Symposium on Electromagnetic Launch Technology - Influence of rail resistivity and rail height on armature edge erosion at current ramp-up
Chen, Lixue, He, Junjia, Xia, Shengguo, Xiao, Zheng, Feng, DengYear:
2012
Language:
english
DOI:
10.1109/eml.2012.6325143
File:
PDF, 362 KB
english, 2012