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[IEEE Fifth IEEE International Conference on Data Mining (ICDM'05) - Houston, TX, USA (27-30 Nov. 2005)] Fifth IEEE International Conference on Data Mining (ICDM'05) - Average Number of Frequent (Closed) Patterns in Bernouilli and Markovian Databases
Lhote, L., Rioult, F., Soulet, A.Year:
2005
Language:
english
DOI:
10.1109/icdm.2005.31
File:
PDF, 111 KB
english, 2005