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[IEEE 2009 IEEE 8th International Conference on ASIC (ASICON) - Changsha, Hunan, China (2009.10.20-2009.10.23)] 2009 IEEE 8th International Conference on ASIC - Characterization of WID delay variability using RO-array test structures
Onodera, Hidetoshi, Terada, HaruhikoYear:
2009
Language:
english
DOI:
10.1109/asicon.2009.5351332
File:
PDF, 4.09 MB
english, 2009