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[IEEE 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Bali, Indonesia (2006.06.26-2006.06.30)] 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Comparison of the Breakdown Strength of N2, CO2 and SF6 using the Extended Up-and-Down Method
Meijer, S., Smit, J.J., Girodet, A.Year:
2006
Language:
english
DOI:
10.1109/icpadm.2006.284262
File:
PDF, 3.81 MB
english, 2006