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[IEEE 2009 IEEE/SP 15th Workshop on Statistical Signal Processing (SSP) - Cardiff, United Kingdom (2009.08.31-2009.09.3)] 2009 IEEE/SP 15th Workshop on Statistical Signal Processing - RMT “single-cluster” criterion for predicting large errors (outliers) in maximum-likelihood detection-estimation
Abramovich, Yuri I., Johnson, Ben A., Spencer, Nicholas K.Year:
2009
Language:
english
DOI:
10.1109/ssp.2009.5278593
File:
PDF, 130 KB
english, 2009