[IEEE 2012 19th IEEE International Conference on Image Processing (ICIP 2012) - Orlando, FL, USA (2012.09.30-2012.10.3)] 2012 19th IEEE International Conference on Image Processing - Evaluating the quality of individual SIFT features
Su, Hui, Chuang, Wei-Hong, Lu, Wenjun, Wu, MinYear:
2012
Language:
english
DOI:
10.1109/icip.2012.6467375
File:
PDF, 578 KB
english, 2012