[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - CMOS-based monitoring of contact events up to 4 MHz in ohmic RF MEMS switches
Fruehling, Adam, Abu Khater, Mohammad, Jung, Byunghoo, Peroulis, DimitriosYear:
2010
Language:
english
DOI:
10.1109/mwsym.2010.5517174
File:
PDF, 1.36 MB
english, 2010