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[IEEE Conference on Precision Electromagnetic Measurements - Ottawa, Ont., Canada (11-14 June 1990)] Conference on Precision Electromagnetic Measurements - Wideband characterization of aluminum nitride (AlN) substrates and high frequency application on these substrates
Farzanehfard, H., Elshabini-Riad, A.Year:
1990
Language:
english
DOI:
10.1109/cpem.1990.109996
File:
PDF, 195 KB
english, 1990