[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Degradation of p-channel power VDMOSFETs under pulsed NBT stress
Djoric-Veljkovic, S., Dankovic, D., Prijic, A., Manic, I., Davidovic, V., Golubovic, S., Prijic, Z., Stojadinovic, N.Year:
2010
Language:
english
DOI:
10.1109/miel.2010.5490448
File:
PDF, 259 KB
english, 2010