[IEEE 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2010.11.7-2010.11.11)] 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs
Mu, Szu-Pang, Wang, Yi-Ming, Yang, Hao-Yu, Chao, Mango C.-T., Chen, Shi-Hao, Tseng, Chih-Mou, Tsai, Tsung-YingYear:
2010
Language:
english
DOI:
10.1109/iccad.2010.5654118
File:
PDF, 2.81 MB
english, 2010