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[IEEE 2011 6th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Beijing, China (2011.06.21-2011.06.23)] 2011 6th IEEE Conference on Industrial Electronics and Applications - Integrated state test system of high voltage circuit breakers based on embedded technology
Fan, Yang, Chenxi, Qiao, Xiaohui, Zhang, Jun, Dong, Yujie, Pei, Xiaoguang, HuYear:
2011
Language:
english
DOI:
10.1109/iciea.2011.5975847
File:
PDF, 279 KB
english, 2011