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[IEEE Nanophotonics - Istanbul, Turkey (2011.08.8-2011.08.11)] 16th International Conference on Optical MEMS and Nanophotonics - Development of nanometer scale temperature measurement method with polarized near-field light
Hosaka, Shunsuke, Nitta, Jumpei, Taguchi, Yoshihiro, Nagasaka, Yuji, Saiki, ToshiharuYear:
2011
Language:
english
DOI:
10.1109/omems.2011.6031103
File:
PDF, 383 KB
english, 2011