[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Design Optimization of Time-and Cost-Constrained Fault-Tolerant Distributed Embedded Systems
Izosimov, V., Pop, P., Eles, P., Zebo Peng,Year:
2005
Language:
english
DOI:
10.1109/date.2005.116
File:
PDF, 209 KB
english, 2005