[IEEE 1993 Fifth Annual IEEE International Conference on...

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[IEEE 1993 Fifth Annual IEEE International Conference on Wafer Scale Integration - San Francisco, CA, USA (20-22 Jan. 1993)] 1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration - Characterization of the broadband transmission behavior of interconnections on silicon substrates

Zaage, S., Groteluschen, E.
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Year:
1993
Language:
english
DOI:
10.1109/icwsi.1993.255251
File:
PDF, 470 KB
english, 1993
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