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[IEEE 2007 7th IEEE Conference on Nanotechnology (IEEE-NANO) - Hong Kong, China (2007.08.2-2007.08.5)] 2007 7th IEEE Conference on Nanotechnology (IEEE NANO) - Reliability study on tri-gate nanowires poly-Si TFTs under DC and AC hot-carrier stress
Yung-Chun Wu,, Hung-Bin Chen,, Li-Wei Feng,, Ting-Chang Chang,, Po-Tsun Liu,, Chun-Yen Chang,Year:
2007
Language:
english
DOI:
10.1109/nano.2007.4601298
File:
PDF, 662 KB
english, 2007