[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - SET tolerance of 65 nm CMOS majority voters: A comparative study
Danilov, Igor A., Gorbunov, Maxim S., Antonov, Andrey A.Year:
2013
Language:
english
DOI:
10.1109/radecs.2013.6937384
File:
PDF, 1.32 MB
english, 2013