![](/img/cover-not-exists.png)
Applying line-series-shunt calibration to one-tier on-wafer device de-embedding up to millimeter waves
Huang, Chien-Chang, Chen, Yu-ChuanVolume:
55
Language:
english
Journal:
Microwave and Optical Technology Letters
DOI:
10.1002/mop.27445
Date:
April, 2013
File:
PDF, 489 KB
english, 2013