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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Test effort optimization by prediction and ranking of fault-prone software modules
Pandey, Ajeet Kumar, Goyal, Neeraj KumarYear:
2010
Language:
english
DOI:
10.1109/icresh.2010.5779531
File:
PDF, 993 KB
english, 2010