[IEEE 2013 IEEE 1st International Conference on Condition...

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[IEEE 2013 IEEE 1st International Conference on Condition Assessment Techniques in Electrical Systems (CATCON) - Kolkata, India (2013.12.6-2013.12.8)] 2013 IEEE 1st International Conference on Condition Assessment Techniques in Electrical Systems (CATCON) - An efficient method of face recognition by fusing original and diagonal images

Dey, Aniruddha, Chowdhury, Shiladitya, Sing, Jamuna Kanta, Basu, Dipak Kumar, Nasipuri, Mita
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Year:
2013
Language:
english
DOI:
10.1109/catcon.2013.6737518
File:
PDF, 375 KB
english, 2013
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