[IEEE 3rd International Conference on Properties and Applications of Dielectric Materials - Tokyo, Japan (8-12 July 1991)] [1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials - Breakdown phenomena in MIS structure
Myung-Nyung Kim,, Kee-Joe Lim,, Min-Ho Bae,, Seong-Hwa Kang,, Young-Gak Yoo,Year:
1991
Language:
english
DOI:
10.1109/icpadm.1991.172204
File:
PDF, 313 KB
english, 1991