![](/img/cover-not-exists.png)
[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Atomic migration in phase change materials
Novielli, G., Ghetti, A., Varesi, E., Mauri, A., Sacco, R.Year:
2013
Language:
english
DOI:
10.1109/iedm.2013.6724683
File:
PDF, 883 KB
english, 2013