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[Int. Test Conference International Test Conference - Washington, DC, USA (2-6 Oct. 1994)] Proceedings., International Test Conference - Transparent memory testing for pattern sensitive faults

Karpovsky, M.G., Yarmolik, V.N.
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Year:
1994
Language:
english
DOI:
10.1109/test.1994.528033
File:
PDF, 884 KB
english, 1994
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