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[IEEE 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011 - Baltimore, MD, USA (2011.06.5-2011.06.10)] 2011 IEEE MTT-S International Microwave Symposium - Image quality enhancement in the microwave raster scanning method
Khalatpour, Ali, Amineh, Reza K., Xu, Haohan, Baskharoun, Yona, Nikolova, Natalia K.Year:
2011
Language:
english
DOI:
10.1109/mwsym.2011.5972875
File:
PDF, 450 KB
english, 2011