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Impact of Temperature Variations on the Device and Circuit Performance of Tunnel FET: A Simulation Study
Narang, Rakhi, Saxena, Manoj, Gupta, R. S., Gupta, MridulaVolume:
12
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2013.2276401
Date:
November, 2013
File:
PDF, 1.24 MB
english, 2013