[IEEE 2011 21st International Conference on Noise and Fluctuations (ICNF) - Toronto, ON, Canada (2011.06.12-2011.06.16)] 2011 21st International Conference on Noise and Fluctuations - Noise spectroscopy of traps in silicon nanowire field-effect transistors
Pud, S., Li, J., Petrychuk, M., Feste, S., Offenhausser, A., Mantl, S., Vitusevich, S.Year:
2011
Language:
english
DOI:
10.1109/icnf.2011.5994309
File:
PDF, 819 KB
english, 2011